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UHCT0030A Ultra-high Frequency Flexible Current Probe with 200mV/A High Sensitivity 50MHz Bandwidth and 3.5mm Ultra-Thin Probe Ring for Semiconductor Testing

UHCT0030A Ultra-high Frequency Flexible Current Probe with 200mV/A High Sensitivity 50MHz Bandwidth and 3.5mm Ultra-Thin Probe Ring for Semiconductor Testing

Brand Name: MEASTEK
Model Number: UHCT0030A
MOQ: 1
Payment Terms: T/T,Western Union,MoneyGram
Detail Information
Sensitivity (mV/A):
200
Peak Current (KA):
0.03
Maximum Noise (mV Vp-p):
20
Attenuation Characteristics (%/ms):
85
Low Frequency Bandwidth -3dB (Hz):
150
Peak Di/dt (A/ns):
2.0
High Frequency Bandwidth -3dB (MHz):
50
Storage Temperature Range:
-40℃~80℃
Highlight:

50MHz Flexible Current Probe

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200mV/A Flexible Current Probe

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Semiconductor Flexible Current Probe

Product Description
UHCT0030A Ultra-high Frequency Flexible Current Probe
200mV/A High Sensitivity 50MHz Bandwidth For Semiconductor / Low Voltage Circuit Detection
Key Features
  • High sensitivity: 200mV/A, accurately captures tiny current signals for precision electronic equipment detection
  • Peak current 0.03kA: Meets low current scenario requirements, ideal for low-voltage circuit ripple analysis
  • High-frequency bandwidth 50MHz: Supports high-speed pulse signal measurement, suitable for IGBT/MOSFET dynamic analysis
  • Low noise design: Maximum noise only 20mV Vp-p, ensuring clear and reliable data
  • Convenient USB power supply: Plug and play operation, no additional power adapter required
  • 3.5mm ultra-thin probe ring: Easily handles narrow space wiring measurements
Technical Parameters
ModelUHCT0030A
Sensitivity (mV/A)200
Peak current (kA)0.03
Maximum noise (mV Vp-p)20
Attenuation characteristics (%/ms)85
Low frequency bandwidth -3dB (Hz)150
Peak di/dt (A/ns)2.0
High frequency bandwidth -3dB (MHz)50
Note: If you need a larger range, please consult the manufacturer. Customization available according to your requirements.
Additional Technical Specifications
Accuracy2%
Insulation withstand voltage value2KV
Terminal load≥100kΩ
Power supply methodUSB 5V (standard adapter)
Ring circumference100mm (customizable)
Coil lead length1.0m (customizable)
Operating temperature rangeIntegrator: 0℃ - 50℃
Probe ring: 0℃ - 100℃
Storage temperature range-40℃~80℃
Front end dimensionsApprox. 110(L)×45(W)×30(H)mm
Probe weightIntegrator: Approx. 125g
Total weight: Approx. 180g
Product Interface Description
UHCT0030A Ultra-high Frequency Flexible Current Probe with 200mV/A High Sensitivity 50MHz Bandwidth and 3.5mm Ultra-Thin Probe Ring for Semiconductor Testing 0
  • Input interface: Probe ring input interface
  • Output interface: Integrator output interface
  • USB 5V power supply interface: Standard USB (type B) interface, USB power supply cable included
  • Probe induction ring body diameter: 3.5mm
  • Coil circumference: 100mm
Care And Maintenance
The current transmitter can only be guaranteed to operate safely and trouble-free if it is properly transported, stored, installed, and carefully operated and maintained.
  • Keep the probe clean and dry, and wipe it with a soft dry cloth
  • When transporting the probe, put it in the standard packaging to prevent shock
  • Do not force the flexible probe ring and connecting wire to avoid damage due to excessive twisting, bending or knotting
Packing List
ComponentQuantity
Integrator1 piece
Flexible coil1 piece
USB output adapter (5V/1A)1 piece
USB power cable1 piece
BNC output cable1 piece
Electronic manual1 copy
Important Measurement Notes
  • To ensure measurement accuracy, the measured wire should pass through the center of the probe ring during measurement
  • The error is greatest at the junction of the induction rings, and the measured wire should try to avoid this area
  • Make sure the probe ring is inserted in place (to the bottom) during measurement, otherwise it will affect the measurement accuracy
  • When measuring the signal, if there is a strong magnetic field interference source nearby (such as a magnetic field radiation source composed of multiple coils), it should be kept as far away as possible to prevent measurement errors